Jacon wrote:Have you read AN2834 Application Note ?
http://www.st.com/web/en/resource/technical/document/application_note/CD00211314.pdf
Hi Jacon,
Unfortunately after reading the application note, there didn't seem to be issue that's exactly as what I'm facing.
At the first glance, I thought it is the "High Impedance Source Measurement", as they have repeated pattern of noise, but the "pulse" that I'm facing is not exactly having decaying pattern as in the application note.
Nonetheless, thank you for the suggestion to look into that! It'll definitely help me designing more robust sampling system once I tackle the above-mentioned issues!
- Sam